Aehr Test Systems

NasdaqCM:AEHR

Sector

🤖 Technology

Industries

💻 Semiconductors

🖨 3D Printing

🤖 Artificial Intelligence (AI)

🔌 Hardware & Electronics

🩺 Medical Instruments

Location

United States

Market Cap

USD 337.01 M

Share Price

USD 11.32

Avg Daily Volume

717,550

Change (1 day)

-5.03%

Change (1 year)

-17.31%

Change (YTD)

-31.93%

Aehr Test Systems Free Cash Flow Yield on June 13, 2025: -1.81%

Aehr Test Systems Free Cash Flow Yield is -1.81% on June 13, 2025, a -823.20% change year over year. Free cash flow yield compares the return from free cash flow to the market cap; higher yield suggests attractive investment.

Aehr Test Systems 52-week low Free Cash Flow Yield is 0.34% on June 13, 2025, which is 118.64% above the current Free Cash Flow Yield.
Aehr Test Systems 52-week low Free Cash Flow Yield is -3.02% on June 13, 2025, which is -66.98% below the current Free Cash Flow Yield.
Aehr Test Systems average Free Cash Flow Yield for the last 52 weeks is -0.90%.

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Key data

Date	Free Cash Flow Yield	Dividend Yield	Market Capitalization	Share Price

NasdaqCM: AEHR

Aehr Test Systems

CEO	Mr. Gayn Erickson
IPO Date	Aug. 15, 1997
Location	United States
Headquarters	400 Kato Terrace
Employees	115
Sector	🤖 Technology
Industries Semiconductors 🖨 3D Printing 🤖 Artificial Intelligence (AI) 🔌 Hardware & Electronics 🩺 Medical Instruments

Description

Aehr Test Systems provides test systems for burning-in and testing logic, optical, and memory integrated circuits worldwide. It offers products, such as the ABTS and FOX-P families of test and burn-in systems and FOX WaferPak Aligner, FOX-XP WaferPak Contactor, FOX DiePak Carrier, and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for lower power and higher power logic devices, as well as various common types of memory devices. The FOX-XP and FOX-NP systems are wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a single-wafer compact test and reliability verification solution for logic, memory, and photonic devices. The WaferPak Contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform final test and burn-in of bare die and modules. Aehr Test Systems was incorporated in 1977 and is headquartered in Fremont, California.