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Aehr Test Systems

NasdaqCM:AEHR

Location

United States

Market Cap

USD 331.95 M

Share Price

USD 11.15

Avg Daily Volume

717,550

Change (1 day)

-3.13%

Change (1 year)

4.50%

Change (YTD)

-32.95%

Aehr Test Systems Share Price Year-To-Date (YTD) return on June 20, 2025: -32.95%

Aehr Test Systems Share Price Year-To-Date (YTD) return is -32.95% on June 20, 2025. Share price reflects current trading price of a company's stock; influenced by market dynamics and company performance. Year-to-Date (YTD) return is is the percentage change in the price of a stock from the start of the calendar year up to the current date, it shows how much the stock has gained or lost since the beginning of the year.
  • Aehr Test Systems 52-week low Share Price is USD 20.61 on June 20, 2025, which is 84.84% above the current Share Price.
  • Aehr Test Systems 52-week low Share Price is USD 6.78 on June 20, 2025, which is -39.19% below the current Share Price.
  • Aehr Test Systems average Share Price for the last 52 weeks is USD 12.10.
Key data
Date Share Price Year-To-Date (YTD) return Price to Earnings Ratio (P/E) Price to Book Ratio (P/B) Price to Sales Ratio (P/S)
Market news
NasdaqCM: AEHR

Aehr Test Systems

CEO Mr. Gayn Erickson
IPO Date Aug. 15, 1997
Location United States
Headquarters 400 Kato Terrace
Employees 115
Sector 🤖 Technology
Industries
Semiconductors
🖨 3D Printing
🤖 Artificial Intelligence (AI)
🔌 Hardware & Electronics
🩺 Medical Instruments
Description

Aehr Test Systems provides test systems for burning-in and testing logic, optical, and memory integrated circuits worldwide. It offers products, such as the ABTS and FOX-P families of test and burn-in systems and FOX WaferPak Aligner, FOX-XP WaferPak Contactor, FOX DiePak Carrier, and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for lower power and higher power logic devices, as well as various common types of memory devices. The FOX-XP and FOX-NP systems are wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a single-wafer compact test and reliability verification solution for logic, memory, and photonic devices. The WaferPak Contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform final test and burn-in of bare die and modules. Aehr Test Systems was incorporated in 1977 and is headquartered in Fremont, California.

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